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说明： 这篇文章主要介绍 ARM JTAG 调试的基本原理。基本的内容包括了 TAP (TEST ACCESS
PORT) 和 BOUNDARY-SCAN ARCHITECTURE 的介绍，在此基础上，结合 ARM7TDMI 详细
介绍了的 JTAG 调试原理。
(This article introduces the basic principles of ARM JTAG debug. The basic elements include TAP (TEST ACCESS PORT) and BOUNDARY-SCAN ARCHITECTURE introduction, in this based on the combination described in detail in the ARM7TDMI JTAG debugging principles.)
(This article introduces the basic principles of ARM JTAG debug. The basic elements include TAP (TEST ACCESS PORT) and BOUNDARY-SCAN ARCHITECTURE introduction, in this based on the combination described in detail in the ARM7TDMI JTAG debugging principles.)
文件列表：
ARM.JTAG.调试原理.pdf,584540,2010-09-09
